Journal
IEEE TRANSACTIONS ON POWER ELECTRONICS
Volume 34, Issue 8, Pages 8008-8016Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPEL.2018.2883989
Keywords
Correlation coefficient; fault diagnosis and location; modular multilevel converter (MMC); open-circuit fault
Categories
Funding
- Nanyang Technological University [NTU-SUG M4081608]
- National Natural Science Foundation of China [51807169]
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Fault diagnosis is indispensable for the reliable operation of modular multilevel converters (MMCs). This paper presents a submodule voltage similarity-based, real-time, and fast opencircuit fault diagnosis method forMMCs. The proposed fault detection and location (FDL) method is derived based on the similarity analysis of capacitor voltages under both normal and fault conditions. Due to the absence of the discharging current path caused by the open-circuit fault, capacitor voltage of the submodule with the faulty switch will differ from those with healthy switches. This characteristic can be extracted by designing the correlation coefficients of the capacitor voltages at the same arm. With the help of correlation coefficients, the open-circuit fault can be located at the early stage before the capacitor voltage is charged very high. All the data required for the proposed FDL method can be obtained by the available sampled data for the control scheme of MMCs. No extra measurement or hardware is required. Experimental results validate that the proposed FDL method can detect and locate the open-circuit fault rapidly and accurately within one fundamental period.
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