4.6 Article

A 9.1-ENOB 6-mW 10-Bit 500-MS/s Pipelined-SAR ADC With Current-Mode Residue Processing in 28-nm CMOS

Journal

IEEE JOURNAL OF SOLID-STATE CIRCUITS
Volume 54, Issue 9, Pages 2532-2542

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2019.2926648

Keywords

Analog to digital converter (ADC); current-domain; current-mode residue processing; gm-cell; open-loop amplifier; pipelined-successive-approximation register (SAR); split current digital-to-analog converter (DAC)

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This paper introduces a current-mode residue processing technique in a pipelined-successive-approximation register (SAR) analog-to-digital converter (ADC), which extends the operation speed of a single-channel ADC utilizing low-impedance-based signaling. A 10-bit pipelined-SAR ADC with featured building blocks such as a degenerated gm-cell as an open-loop residue amplifier, a switched-current mirror for sample-and-hold (S/H) function, and a split current digital-to-analog converter (DAC) for current-domain SAR conversion achieves a 500-MS/s conversion-rate under a 1.0-V supply. With background inter-stage mismatch calibration, a prototype ADC fabricated in a 28-nm CMOS process achieves 56.6-dB signal-to-noise-and-distortion ratio (SNDR) at a Nyquist input, resulting in a Walden figure of merit (FoM) of a 21.7-fJ/conversion-step.

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