Journal
APPLIED PHYSICS LETTERS
Volume 115, Issue 12, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.5117881
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Funding
- HZB
- ETH Zurich
- SNF [200021_149192]
- NTNU
- European Research Council under the European Union [724529]
- Ministerio de Economia, Industria y Competitividad [MAT2016-77100-C2-2-P, SEV-2015-0496]
- Generalitat de Catalunya [2017SGR 1506]
- ERC (Complexplas)
- DFG
- BW Stiftung
- MWK BW (ZAQuant, IQST)
- U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division under Quantum Materials Program [DE-AC02-05-CH11231, KC2202]
- European Research Council (ERC) [724529] Funding Source: European Research Council (ERC)
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Low-temperature X-ray photoemission electron microscopy (X-PEEM) is used to measure the electric potential at domain walls in improper ferroelectric Er0.99Ca0.01MnO3. By combining X-PEEM with scanning probe microscopy and theory, we develop a model that relates the detected X-PEEM contrast to the emergence of uncompensated bound charges, explaining the image formation based on intrinsic electronic domain-wall properties. In contrast to previously applied low-temperature electrostatic force microscopy (EFM), X-PEEM readily distinguishes between positive and negative bound charges at domain walls. Our study introduces an X-PEEM-based approach for low-temperature electrostatic potential mapping, facilitating nanoscale spatial resolution and data acquisition times on the order of 0.1-1 s.
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