4.6 Article

Soft x-ray ptychography studies of nanoscale magnetic and structural correlations in thin SmCo5 films

Journal

APPLIED PHYSICS LETTERS
Volume 108, Issue 9, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4942776

Keywords

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Funding

  1. Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy [DE-AC02-05-CH11231]
  2. Office of Science, Office of Basic Energy Sciences, Scientific User Facilities Division, of the U.S. Department of Energy [DE-AC02-05-CH11231]
  3. U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Science and Engineering [DE-FG02-11ER46831]
  4. Center for Applied Mathematics for Energy Research Applications (CAMERA)

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High spatial resolution magnetic x-ray spectromicroscopy at x-ray photon energies near the cobalt L-3 resonance was applied to probe an amorphous 50 nm thin SmCo5 film prepared by off-axis pulsed laser deposition onto an x-ray transparent 200 nm thin Si3N4 membrane. Alternating gradient magnetometry shows a strong in-plane anisotropy and an only weak perpendicular magnetic anisotropy, which is confirmed by magnetic transmission soft x-ray microscopy images showing over a field of view of 10 mu m a primarily stripe-like domain pattern but with local labyrinth-like domains. Soft x-ray ptychography in amplitude and phase contrast was used to identify and characterize local magnetic and structural features over a field of view of 1 mu m with a spatial resolution of about 10 nm. There, the magnetic labyrinth domain patterns are accompanied by nanoscale structural inclusions that are primarily located in close proximity to the magnetic domain walls. Our analysis suggests that these inclusions are nanocrystalline Sm2Co17 phases with nominally in-plane magnetic anisotropy. (C) 2016 AIP Publishing LLC.

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