4.7 Article

Comparison study of ZnO-based quaternary TCO materials for photovoltaic application

Journal

JOURNAL OF ALLOYS AND COMPOUNDS
Volume 793, Issue -, Pages 499-504

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2019.04.042

Keywords

Mg- and Ga-doped ZnO; Mg- and Al-doped ZnO; Mg- and In-doped ZnO; Thin film solar cells; Wide band gap

Funding

  1. Human Resources Development program of the korea Institute of Energy Technology Evaluation and Planning(KETEP) - Korea government Ministry of Trade, Industry and Energy [20164030201310]
  2. Technology Development Program to Solve Climate Changes of the National Research Foundation (NRF) - Ministry of Science, ICT & Future Planning [2016936784]

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ZnO is of great interest for large-area optoelectronic devices, e.g., flat panel displays, light-emitting diodes, transparent semiconductors, and transparent conductive oxides (TCOs) etc., owing to its good optical properties. In the present study, quaternary ZnO thin films are deposited on a soda lime glass substrate using Mg and group III elements, such as Al, Ga, and In, to enhance the optical and electrical properties. The structural, optical, and electrical properties of quaternary ZnO TCO materials are investigated for improved thin film solar cell performance. All of the films show a uniform microstructure without any void and crack and have a transmittance over 75% in the visible region. They possess comparable band gap differences. Especially, as for the optical properties, a Mg and Ga co-doped ZnO, MgGaZnO (MGZO) thin film shows a high optical band gap of 3.87 eV with a transmittance of about 90% in the visible region. In addition, the MGZO thin film shows improved electrical properties with the lowest resistivity of 3.97 x 10(-4) Omega cm, higher carrier concentration of 1.11 x 10(21)cm(-3), high mobility of 14.07 cm(2)V(-1)s(-1) and lower sheet resistance of 7.39 Omega/sq. Moreover, a wide band gap of 3.87 eV is obtained for MGZO thin films, and the performance of a Cu2ZnSn(S, Se)(4) (CZTSSe) photovoltaic device fabricated with a MGZO TCO layer is improved owing to higher band gap and outstanding electronic properties. The improved short circuit current results in a device with a MGZO thin film with a power conversion efficiency of 8.79%. (C) 2019 Elsevier B.V. All rights reserved.

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