Journal
APPLIED PHYSICS LETTERS
Volume 108, Issue 15, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4945983
Keywords
-
Categories
Funding
- National Natural Science Foundation of China [51171076, 51101079, 51201083, 11574122]
- Fundamental Research Funds for Central Universities [lzujbky-2015-122]
- Natural Science Foundation of Gansu Province [145RJZA154]
Ask authors/readers for more resources
The epitaxial growth of FeSi film on (001) 0.68Pb(Mg1/3Nb2/3)O-3-0.32PbTiO(3) (PMN-0.32PT) was fabricated by sputtering and confirmed by high-resolution transmission electron microscopy. A fourfold symmetric angular remanent magnetization curve of as-deposited FeSi thin film is well fitted theoretically by considering the cubic magnetocrystalline anisotropy. We found that the fourfold anisotropy decreases slightly when an electric field (E) is applied on the Pt/PMN-0.32PT/FeSi/Ta heterostructures with Pt layer as the positive electrode. However, a magnetic anisotropy transition from fourfold anisotropy to twofold anisotropy occurs under negative E. The strain-electric field curve suggests that the observed different variation trend of magnetic anisotropy results from the asymmetric strain response on the polarity of E. Moreover, once the transition happens, it was irreversible unless the heterostructures are heated above the phase transition temperature of PMN-0.32PT. (C) 2016 AIP Publishing LLC.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available