4.6 Article

A Charge Plasma-Based Monolayer Transition Metal Dichalcogenide Tunnel FET

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 6, Pages 2837-2843

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2019.2909182

Keywords

Charge plasma concept; transition metal dichalcogenide (TMD); tunneling field-effect transistors (TFETs)

Funding

  1. INSPIRE Program of Department of Science and Technology (DST), Government of India

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In this paper, a charge plasma-based monolayer transition metal dichalcogenide (TMD) tunneling field-effect transistor (TFET) is investigated by solving self-consistent 3-D Poisson and Schrodinger equations in nonequilibrium Green's function(NEGF) framework. We propose a work function engineered charge plasma-based dual-metal source TFET (DMS TFET) structure for an optimum performance of the device. The proposed TFET structure demonstrates superior performance than the conventional charge plasma TFETs in terms of ION, I-ON/I-OFF ratio, and sub-threshold slope (SS). It provides ION of 222 mu A/mu m, I-ON/I-OFF ratio of 2.22 x 10(5), a minimum SS of 42.41 mV/decade, and an average SS of 54.15 mV/decade for three-decade increase in drain current (I-DS). The performance of the device is observed at different channel lengths. Based on this analysis, a device design guideline for sub-10-nm channel length TFETs is presented in the paper. Finally, the circuit level metrics of the proposed structure are estimated by calculating delay and energy-delay product of a 45-stage inverter chain.

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