Journal
ELECTROCHEMISTRY COMMUNICATIONS
Volume 103, Issue -, Pages 7-11Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.elecom.2019.04.008
Keywords
Sulfolane; Silicon deposition; Quartz crystal microbalance; Frequency damping; Copper silicide
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Funding
- State of Thuringia
- European Union [12021-715]
- German Research Foundation (DFG)
- Technische Universitat Ilmenau
- Cusanuswerk
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As a low-cost, non-volatile, highly polar and chemically stable solvent, sulfolane has a high implementation potential for electroplating in organic media. This is the first report of the electrodeposition of silicon from sulfolane-based electrolytes. Voltammetric and chronoamperometric techniques, coupled with a quartz crystal microbalance, have been used to perform and characterize the process. Resonance frequency, f, damping, w, and apparent molar mass, M-app are used as sensitive parameters for the evaluation of the silicon layer formation. Si electrodeposition displays a strong dependence on the applied potential. Close to theoretical values for M-app and minimal w are observed at low deposition overpotentials, which allow an in situ quantitative mass evaluation. At higher overpotentials the process efficiency decreases due to simultaneous electrolyte decomposition. The electrodeposition of elemental Si (approx. 60% of the entire Si content) is evidenced by X-ray photoelectron spectroscopy. Additionally, the formation of a binary metal compound with the Cu substrate might be a key factor in the very good adhesion and mechanical stability of the layer.
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