Thermal atomic layer etching of crystalline GaN using sequential exposures of XeF2 and BCl3

Gallium nitride (GaN) is a wide-bandgap semiconductor that is useful for optoelectronics and high speed and high power electronics. Fabrication of GaN devices requires etching for many processing steps. Gas phase thermal atomic-layer-controlled etching is desirable for damage-free isotropic etching. In this letter, the thermal atomic layer etching (ALE) of crystalline GaN was demonstrated using sequential exposures of XeF2 and BCl3. GaN ALE was achieved with an etch rate of 0.55 angstrom/cycle at 195 degrees C using XeF2 exposures for 20 s at 40 mTorr and BCl3 exposures for 0.5 s at 50 mTorr. At the same reactant exposures, GaN etch rates varied with temperature from 0.18 angstrom/cycle at 170 degrees C to 0.72 angstrom/cycle at 300 degrees C. The GaN etch rates increased slowly with increasing XeF2 exposure. In addition, the GaN etch rate was self-limiting with respect to both increasing BCl3 pressures and BCl3 exposure times. This self-limiting behavior for BCl3 is consistent with a ligand-exchange mechanism for GaN ALE. Alternative fluorination reactants were also investigated including HF, SF4, and NF3 plasma. Sequential exposures of NF3 plasma and BCl3 yielded GaN etch rates of 2.5-2.9 angstrom/cycle at 250 degrees C. In contrast, the HF and SF4 fluorination reactants could not etch crystalline GaN.