Journal
ACS NANO
Volume 13, Issue 7, Pages 8055-8066Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsnano.9b02883
Keywords
atomic force microscopy; piezoresponse force microscopy; electrochemical strain microscopy; hysteresis; nonlocal effects
Categories
Funding
- U.S. DOE Office of Science User Facility [DE-AC05-00OR22725]
- U.S. Department of Energy [DE-AC05-00OR22725]
Ask authors/readers for more resources
The ability to probe a material's electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage-modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its ability to locally probe electromechanically responsive materials with spatial resolution from micrometers to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy and electrochemical strain microscopy there has been a rise in reports of nanoscale electromechanical functionality, including hysteresis, in materials that should be incapable of exhibiting piezo- or ferroelectricity. Explanations for the origins of unexpected nanoscale phenomena have included new material properties, surface-mediated polarization changes, and/or spatially resolved behavior that is not present in bulk measurements. At the same time, it is well known that VM-AFM measurements are susceptible to numerous forms of crosstalk, and, despite efforts within the AFM community, a global approach for eliminating this has remained elusive. In this work, we develop a method for easily demonstrating the presence of hysteretic (i.e., false ferroelectric) long-range interactions between the sample and cantilever body. This method should be easy to implement in any VM-AFM measurement. We then go on to demonstrate fully quantitative and repeatable nanoelectromechanical characterization using an interferometer. These quantitative measurements are critical for a wide range of devices including MEMS actuators and sensors, memristor, energy storage, and memory.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available