Journal
SCIENCE CHINA-MATERIALS
Volume 62, Issue 9, Pages 1323-1331Publisher
SCIENCE PRESS
DOI: 10.1007/s40843-019-9433-4
Keywords
Ag filament; perovskite memory; analog switch; threshold switch; resistance mechanism
Categories
Funding
- National Natural Science Foundation of China [51872036, 51773025]
- Dalian Science and Technology Innovation Fund [2018J12GX033]
- National Key R&D Program of China [2017YFB0405604]
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Organic-inorganic hybrid perovskites (OHPs) are well-known as light-absorbing materials in solar cells and have recently attracted considerable attention for the applications in resistive switching memory. Previous studies have shown that ions can migrate to form a conductive channel in perovskites under an external voltage. However, the exact resistance mechanism for Ag or halogens which dominate the resistive behavior is still controversial. Here, we demonstrate a resistive switching memory device based on Ag/FA(0.83)MA(0.17)Pb(I0.82Br0.18)(3)/fluorine doped tin oxide (FTO). The migration of Ag cations and halide anions is demonstrated by energy dispersive X-ray spectroscopy (EDS) after the SET process (positive voltage on Ag). By comparing the I-V behavior of the Au-based devices, it is clear that the conductive channel formed by Ag is the main factor of the switching characteristics for Ag-based devices. Meanwhile, by controlling the appropriate SET voltage, two kinds of resistance characteristics of the analog switch and threshold switch can be realized in the Ag-based device. As a result, it may be possible to implement both data storage and neuromorphic computing in a single device.
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