Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 26, Issue -, Pages 629-634Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577519002431
Keywords
X-ray emission spectroscopy; tender X-rays; X-ray absorption spectroscopy; X-ray free-electron lasers; photon-in photon-out spectroscopy methods
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Funding
- US Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-76SF00515]
- Office of Science of the US Department of Energy [DE-AC02-05CH11231]
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An X-ray emission spectrometer that can detect the sulfur K emission lines with large throughput and a high energy resolution is presented. The instrument is based on a large d-spacing perfect Bragg analyzer that diffracts the sulfur K emission at close to backscattering angles. This facilitates the application of efficient concepts routinely employed in hard X-ray spectrometers towards the tender X-ray regime. The instrument described in this work is based on an energy-dispersive von Hamos geometry that is well suited for photon-in photon-out spectroscopy at X-ray free-electron laser and synchrotron sources. Comparison of its performance with previously used instrumentation is presented through measurements using sulfur-containing species performed at the LCLS. It is shown that the overall signal intensity is increased by a factor of approximate to 15. Implementation of this approach in the design of a tender X-ray spectroscopy endstation for LCLS-II is also discussed.
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