4.7 Article

A Facile, Low-Cost Plasma Etching Method for Achieving Size Controlled Non-Close-Packed Monolayer Arrays of Polystyrene Nano-Spheres

Journal

NANOMATERIALS
Volume 9, Issue 4, Pages -

Publisher

MDPI
DOI: 10.3390/nano9040605

Keywords

plasma etching; non-close-packed monolayer array; ultra-high aspect ratio nanowire; Si nanowire; metal-assisted chemical etching

Funding

  1. General Research Fund from the Hong Kong Research Grants Council [14243616]
  2. National Natural Science Foundation of China [51605100, U1601202, 51705090, 2017-060]
  3. Natural Science Foundation of Guangdong Province [2017A030313314, 2016A030310347, 2016A030308016]
  4. Guangdong Key Project of Science, Technology and Innovation [2018B090906002, 2019B020231001]
  5. Hong Kong scholar program [2017-060]

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Monolayer nano-sphere arrays attract great research interest as they can be used as templates to fabricate various nano-structures. Plasma etching, and in particular high-frequency plasma etching, is the most commonly used method to obtain non-close-packed monolayer arrays. However, the method is still limited in terms of cost and efficiency. In this study, we demonstrate that a low frequency (40 kHz) plasma etching system can be used to fabricate non-close-packed monolayer arrays of polystyrene (PS) nano-spheres with smooth surfaces and that the etching rate is nearly doubled compared to that of the high-frequency systems. The study reveals that the low-frequency plasma etching process is dominated by a thermal evaporation etching mechanism, which is different from the atom-scale dissociation mechanism that underlines the high-frequency plasma etching. It is found that the polystyrene nano-sphere size can be precisely controlled by either adjusting the etching time or power. Through introducing oxygen as the assisting gas in the low frequency plasma etching system, we achieved a coalesced polystyrene nano-sphere array and used it as a template for metal-assisted chemical etching. We demonstrate that the method can significantly improve the aspect ratio of the silicon nanowires to over 200 due to the improved flexure rigidity.

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