4.5 Article

Design, characterization, and performance of a hard x-ray transmission microscope at the National Synchrotron Light Source II 18-ID beamline

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 90, Issue 5, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.5088124

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Funding

  1. DOE Office of Science [DE-SC0012704]

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A transmission X-ray microscope has been designed and commissioned at the 18-ID Full-field X-ray Imaging beamline at the National Synchrotron Light Source II. This instrument operates in the 5-11 keV range, and, with the current set of optics, is capable of 30 nm spatial resolution imaging, with a field of view of about 40 mu m. For absorption contrast, the minimum exposure time for a single projection image is about 20 ms and an entire 3D tomography data set can be acquired in under 1 min. The system enables tomographic reconstructions with sub-50 nm spatial resolution without the use of markers on the sample or corrections for rotation run-outs. Published under license by AIP Publishing.

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