Journal
OPTICS COMMUNICATIONS
Volume 436, Issue -, Pages 69-75Publisher
ELSEVIER
DOI: 10.1016/j.optcom.2018.12.005
Keywords
Fluorescence microscopy; Super resolution; Structured illumination microscopy; Image reconstruction; Parameter estimation
Categories
Funding
- German research foundation, Germany (Deutsche Forschungsgemeinschaft, DFG) [SFB TR166, TP B05]
- Free State of Thuringia [2015 FGI 0008]
- European Union funds under the European Regional Development Fund (EFRE)
- Swedish Foundation for Strategic Research (SSF), Sweden [RIF14-0079]
- COST Action, Sweden [CA15124]
- Swedish Foundation for Strategic Research (SSF) [RIF14-0079] Funding Source: Swedish Foundation for Strategic Research (SSF)
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The impact of the different reconstruction parameters in super-resolution structured illumination microscopy (SIM) on image artifacts is carefully analyzed. These parameters comprise the Wiener filter parameter, an apodization function, zero-frequency suppression and modifications of the optical transfer function. A detailed investigation of the reconstructed image spectrum is concluded to be suitable for identifying artifacts. For this purpose, two samples, an artificial test slide and a more realistic biological system, were used to characterize the artifact classes and their correlation with the image spectra as well as the reconstruction parameters. In addition, a guideline for efficient parameter optimization is suggested and the implementation of the parameters in selected up-to-date processing packages (proprietary and open-source) is depicted.
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