Journal
OPTICS AND LASER TECHNOLOGY
Volume 113, Issue -, Pages 384-393Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.optlastec.2019.01.008
Keywords
Electrodeposition; Bi2Te3; Electrochemical properties; DEDHI; Holography; EIS
Categories
Funding
- University Grants Commission (UGC), New Delhi, India [36-22/13(WRO)]
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In this article, we have used double exposure digital holographic interferometry (DEDHI) technique for surface deformation study and hologram recording during synthesis of the Bi2Te3 thin films by electrodeposition method. The synthesized Bi2Te3 thin films were characterized structural, morphological, electrochemical, wettability and surface deformation study. Further the holograms are recorded during the electrodeposition process by varying the concentration of electrolyte. From the recorded fringes the stress, deposited mass and thickness have been calculated. It is observed that the fringe width, mass of deposited thin films, and stress to substrate changes with the concentration of electrolyte. The DEDHI technique is found more reliable for thickness measurement in electrodeposition process. The EIS study confirms that the deposited material is highly conducting.
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