Journal
MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING
Volume 27, Issue 5, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/1361-651X/ab1e8b
Keywords
grain growth; microstructure; thin film; phase-field method; large-scale simulation
Funding
- Japan Society for the Promotion of Science (JSPS) [16H04490, 17J06356]
- Ministry of Education, Culture, Sports and Technology (MEXT) [26220002]
- Joint Usage/Research Center for Interdisciplinary Large-scale Information Infrastructures
- High Performance Computing Infrastructure in Japan [jh180036-NAH]
- Grants-in-Aid for Scientific Research [17J06356, 16H04490] Funding Source: KAKEN
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In this study, assuming an ideal system free from thermal grooving and anisotropy in grain boundary properties, we analyze thin-film grain growth via three-dimensional (3D) phase-field simulations with approximately one million initial grains. The large-scale simulations accelerated by multiple graphics processing units allow for the reliable statistical investigation of grain growth behaviors in films with various thickness. Over the transition from 3D to two-dimensional (2D) growth modes, variations in the averages and distributions of grain sizes are quantified and compared for different regions of the films. Furthermore, we propose a comprehensive scaling law of thin-film grain growth, by which the 3D-2D transition behaviors and grain growth kinetics can be described in a unified manner independent of film thickness.
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