Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials

Interfaces playafundamental role in many areas of chemistry.However,their localized nature requires characterization techniqueswith high spatial resolution in order to fully understand their structureand properties.State-of-the-art atomic resolution or in situ scanningtransmission electron microscopyand electron energy-loss spectros-copyare indispensable tools for characterizing the local structure andchemistry of materials with single-atom resolution, but they are notable to measure many properties that dictate function, such as vibra-tional modes or charge transfer,and are limited to room-temperaturesamples containing no liquids.Here,weoutline emerging electronmicroscopytechniques that are allowing these limitations to be over-come and highlight several recent studies that were enabled by thesetechniques.Wethen provide avision for howthese techniques can bepaired with eachother and with in situ methods to deliver new insightsinto the static and dynamic behavior of functional interfaces