4.7 Article

Solar blind Schottky photodiode based on an MOCVD-grown homoepitaxial β-Ga2O3 thin film

Journal

APL MATERIALS
Volume 7, Issue 2, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.5064471

Keywords

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Funding

  1. AFOSR [FA9550-17-P-0029, N00014-16-P-2058, FA9550-18-1-0059, FA9550-18-1-0479]
  2. ONR [FA9550-17-P-0029, N00014-16-P-2058]
  3. state of MN DEED Program [IVPP-17-0002]
  4. ARO [W911NF-17-S-0002]

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We report on a high performance Pt/n(-) Ga2O3/n(+)Ga(2)O(3) solar blind Schottky photodiode that has been grown by metalorganic chemical vapor deposition. The active area of the photodiode was fabricated using similar to 30 angstrom thick semi-transparent Pt that has up to 90% transparency to UV radiation with wavelengths < 260 nm. The fabricated photodiode exhibited Schottky characteristics with a turn-on voltage of similar to 1 V and a rectification ratio of similar to 10(8) at +/- 2 V and showed deep UV solar blind detection at 0 V. The Schottky photodiode exhibited good device characteristics such as an ideality factor of 1.23 and a breakdown voltage of similar to 110 V. The spectral response showed a maximum absolute responsivity of 0.16 A/W at 222 nm at zero bias corresponding to an external quantum efficiency of similar to 87.5%. The cutoff wavelength and the out of band rejection ratio of the devices were similar to 260 nm and similar to 10(4), respectively, showing a true solar blind operation with an excellent selectivity. The time response is in the millisecond range and has no long-time decay component which is common in photoconductive wide bandgap devices. (c) 2019 Author(s).

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