Journal
JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
Volume 35, Issue 7, Pages 1354-1363Publisher
JOURNAL MATER SCI TECHNOL
DOI: 10.1016/j.jmst.2019.03.011
Keywords
Al-Mg-Si-Sc; Grain size effect; Mg/Si ratio; Precipitation; Hardness/conductivity
Funding
- National Natural Science Foundation of China [51771147]
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Al-Mg-Si-Sc alloys with different Mg/Si ratio (<1.73 in wt.% vs>1.73 in wt.%) and different grain size (coarse grains vs ultrafine grains) were prepared, which allowed to investigate the grain size-dependent Mg/Si ratio effect on the microstructural evolution and concomitantly on the hardness and electrical conductivity when subjected to aging at 200 degrees C. In the coarse-grained Al-Mg-Sc-Sc alloys, the. beta '' precipitation within the grain interior and also the precipitation hardening were highly dependent on the Mg/Si ratio, while the electrical conductivity was slightly affected by the Mg/Si ratio. A promoted. beta '' precipitation was found in the case of Si excess (Mg/Si ratio <1.73), much greater than in the case of Mg excess (Mg/Si ratio>1.73). While in the ultrafine-grained Al-Mg-Si-Sc alloys, the electrical conductivity rather than the hardness was more sensitive to the Mg/Si ratio. The alloy with Si excess displayed electrical conductivity much higher than its counterpart with Mg excess. This is rationalized by the grain boundary precipitation promoted by Si, which reduced the solute atoms and precipitates within the grain interior. Age softening was found in the ultrafine-grained alloy with Si excess, but the ultrafine-grained alloy with Mg excess held the hardness almost unchanged during the aging. The hardness-conductivity correlation is comprehensively discussed by considering the coupling effect of Mg/Si ratio and grain size. A strategy to simultaneously increase the hardness/strength and electrical conductivity is proposed for the Al-Mg-Si-Sc alloys, based on present understanding of the predominant factors on strengthening and conductivity, respectively. (C) 2019 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
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