Journal
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume 473, Issue -, Pages 312-319Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.jmmm.2018.10.085
Keywords
XRD; Dielectric constant; Lattice strain; LA to saturation method; Magnetocrystalline anisotropy
Funding
- UGC, India [4051/(NET-JUNE 2013), 4050/(NET-JUNE 2013)]
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The lanthanum (La3+) doped M-type barium hexaferrite (Ba1-xLaxFe12O19) with x = 0.0, 0.05, 0.10, 0.15, and 0.20 have been prepared by the sol-gel technique. The Rietveld refinement of X-ray diffraction (XRD) patterns reveals the crystallization of all the samples to hexagonal crystal symmetry with P6(3)/mmc space group. Investigation of Raman spectra strongly supports the XRD pattern analysis. The average grain (particle) size is found to be above 300 nm. Both the saturation magnetization and magnetocrystalline anisotropy have been estimated by employing the Law of Approach (LA) to Saturation magnetization. Both the above parameters are found to be maximum for 10% La doped BaFe12O19. It could be due to the lattice strain mediated magnetism in barium hexaferrite. However, these magnetic parameters decrease with the increase in La doping beyond 10% ( > x = 0.10) in barium hexaferrite. The dielectric permittivity gradually increases with the La concentration in the BHF. A correlation between dielectric constant with the lattice strain has been reported in La3+ doped barium hexaferrite.
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