Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 241, Issue -, Pages -Publisher
ELSEVIER
DOI: 10.1016/j.elspec.2019.02.001
Keywords
Electron-matter interactions; Secondary electron emission; SEY; Surface treatments; Rough coatings; Electron discharge; Low-energy electrons
Categories
Funding
- ESA TRP programs
- Spanish Ministry of Economy, Industry and Competitiveness of Spain under Programa Estatal de Fomento de la Investigacion Cientifica y Tecnica de Excelencia [ESP2015-67842-P, AYA2012-39832-C02-01]
- Spanish Ministry of Economy, Industry and Competitiveness [BES-2013-063612]
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The reduction of the total secondary electron emission during electron-matter interactions is required to improve the maximum power limit of the vacuum RF equipments prone to multipactor discharge. In this work, a chemical deposition technique was developed to create the appropriate micron or submicron surface roughness to significantly improve the typical characteristics of the flat silver coatings used for high-power microwave devices for space applications. Rough silver coated RF filters with a high surface aspect ratio, > 3, was achieved. It is found that the secondary electron emission yield (SEY) remains lower than 1 throughout the primary electron energy range and therefore multipactor electron avalanche is avoided. The influence of aging on the multipactor discharge is also drastically reduced in rough silver coatings. An experimental linear correlation was found between the multipactor power level and the minimum interaction energy for which the number of incident and emitted electrons is equal.
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