4.5 Article

Radiation-Hardened 14T SRAM Bitcell With Speed and Power Optimized for Space Application

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TVLSI.2018.2879341

Keywords

High speed; low power; radiation-hardened SRAM; single-event-multiple-node upsets (SEMNUs); Ssingle-event upset (SEU)

Funding

  1. National Natural Science Foundation of China [61674002, 61474001]
  2. National Science and Technology Major Project [2017ZX01028-101-003]

Ask authors/readers for more resources

In this paper, a novel radiation-hardened 14-transistor SRAM bitcell with speed and power optimized [radiation-hardened with speed and power optimized (RSP)-14T] for space application is proposed. By circuit-and layout-level optimization design in a 65-nm CMOS technology, the 3-D TCAD mixed-mode simulation results show that the novel structure is provided with increased resilience to single-event upset as well as single-event-multiple-node upsets due to the charge sharing among OFF-transistors. Moreover, the HSPICE simulation results show that the write speed and power consumption of the proposed RSP-14T are improved by similar to 65% and similar to 50%, respectively, compared with those of the radiation hardened design (RHD)-12T memory cell.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.5
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available