4.6 Article

Charge-Based EPFL HEMT Model

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 66, Issue 3, Pages 1218-1229

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2019.2893302

Keywords

2-dimensional electron gas (2-DEG); compact modeling; GaAs; GaN; high-mobility field-effect transistor (HEMT); inversion coefficient; pinchoff surface potential; pinchoff voltage; quantum well (QW)

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This paper presents a design-oriented charge-based model for dc operation of AlGaAs/GaAs and AlGaN/GaN-based high-mobility field-effect transistors. The intrinsic model is physics-based and does not introduce any empirical parameter. The central concept is based on the linear approximation of the channel charge density with respect to the surface potential, leading to explicit and continuous expressions for charges and current in all the regions of operation, including subthreshold. In addition, an effective circuit design methodology based on the pinchoff surface potential, the pinchoff voltage and the key concept of inversion coefficient (IC) is proposed, likewise for silicon MOSFET circuits.

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