Journal
APPLIED PHYSICS LETTERS
Volume 114, Issue 11, Pages -Publisher
AIP Publishing
DOI: 10.1063/1.5083031
Keywords
-
Categories
Funding
- Swedish e-Science Centre (SeRC)
- Swedish Government Strategic Research Areas in Materials Science on Functional Materials at Linkoping University (Faculty Grant SFO-Mat-LiU) [2009-00971]
- Swedish Research Council (VR) [2016-04068, 2016-04810]
- Centre in Nano Science and Nanotechnology (CeNano)
- Carl Trygger Stiftelse for Vetenskaplig Forskning [CTS 15: 339]
- JSPS KAKENHI [A 17H01056, 18H03770]
- Ministry of Science and High Education of the Russian Federation [K2-2019-001, 211]
- MTA Premium Postdoctoral Research Program
- National Research Development and Innovation Office of Hungary (NKFIH) within the Quantum Technology National Excellence Program [2017-1.2.1-NKP-2017-00001]
- National Research Development and Innovation Office of Hungary (NKFIH) within NVKP Program [NVKP 16-1-20160043]
- National Research Development and Innovation Office of Hungary (NKFIH) within Excellent Researcher Program [KKP129886]
- EU QuantERA Nanospin (NKFIH) [127902]
- Vinnova [2016-04810] Funding Source: Vinnova
- Swedish Research Council [2016-04068, 2016-04810] Funding Source: Swedish Research Council
Ask authors/readers for more resources
Point defects in semiconductors are relevant for use in quantum technologies as room temperature qubits and single photon emitters. Among suggested defects for these applications are the negatively charged silicon vacancy and the neutral divacancy in SiC. The possible nonequivalent configurations of these defects have been identified in 4H-SiC, but for 6H-SiC, the work is still in progress. In this paper, we identify the different configurations of the silicon vacancy and the divacancy defects to each of the V1-V3 and the QL1-QL6 color centers in 6H-SiC, respectively. We accomplish this by comparing the results from ab initio calculations with experimental measurements for the zero-phonon line, hyperfine tensor, and zero-field splitting. Published under license by AIP Publishing.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available