Journal
ADVANCED ENGINEERING MATERIALS
Volume 18, Issue 6, Pages 913-917Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/adem.201600063
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Funding
- German Science Council Center of Advancing Electronics Dresden, CFAED [EXC1056]
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Energy-filtered backscattered electron imaging in a scanning electron microscope is performed on a blend of zinc-phthalocyanine (ZnPc) and fullerene (C-60), whose morphology is characterized using a novel energy selective backscattered (EsB) electron detector in combination with low acceleration voltages for the primary electrons. Such blends are used as an active layer of organic solar cells in bulk heterojunction architectures. The key to optimizing the solar cell performance is understanding the morphology of the blend components. Comparing the results to TEM micrographs, the EsB detector allows for a simple and fast identification of the phases in the blend. The relevance of the findings for applying ZnPc-C-60 blends in solar cells is also discussed.
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