Journal
PHYSICAL REVIEW APPLIED
Volume 10, Issue 4, Pages -Publisher
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevApplied.10.044001
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Funding
- CREST, Japan Science and Technology Agency (JST) [JPMJCR12C4]
- Japan Society for the Promotion of Science (JSPS) [JP16H06438, JP16H06441]
- Deutsche Forschungsgemeinschaft [YA 511/1-1]
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The alloying of wide-band-gap ZnO and GaN causes band-gap reduction, enabling visible-light-driven photocatalysis for high-efficiency water splitting. However, challenges in single-crystal (GaN)(1-x)(ZnO)(x) solid-solution synthesis prevent a better understanding of the optical properties and electronic structures. Here, low-temperature epitaxial growth of (GaN)(1-x)(ZnO)(x) thin films with a wide tunability of chemical composition is demonstrated by using a multitarget pulsed-laser-deposition (PLD) system. The phase pure (GaN)(1-x)(ZnO)(x) solid solution is obtained by alternately depositing GaN and ZnO with the thickness of each GaN/ZnO pair set within one or two unit cells. The band gap of the solid-solution thin films as a function of systematically controlled chemical composition shows asymmetric bowing with a minimum at approximately 2.0 eV for x = 0.65. Furthermore, a large absorption coefficient (>10(4) cm(-1)) in the visible-light region is observed. The shape of the absorption edge is not consistent with that of a direct-transition semiconductor. First-principles calculation suggests that this inconsistency originates from localization of the valence-band maximum on N atoms bonded with Zn. A technique for fabricating high-quality epitaxial (GaN)(1-x)(ZnO)(x) solid solutions is essential for acquiring a deep understanding of the fundamental properties of this system.
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