Journal
POLYMER
Volume 165, Issue -, Pages 180-190Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.polymer.2019.01.023
Keywords
Atomic force microscopy; Polymer blends; Elastic modulus; Adhesion; Spatial resolution; Property contrast
Categories
Ask authors/readers for more resources
The spatial resolution and the contrast in mechanical property mapping by atomic force microscopy (AFM) modes based on dynamic force-curve acquisition, HarmoniX (TM)(HMX) and Peak-Force-Tapping-QNW (TM)(PET-QNM) modes, are discussed in terms of contact radius, probe type and imaging parameters. The study is based on model polymer samples including elastomers, thermoplastics and thermoset resins and on contact mechanics considerations to provide a better understanding of the main parameters governing spatial resolution and property contrast in AFM-based nanomechanical mapping. The tip-sample interaction area and volume characterized by the contact radius are the key parameters governing the spatial resolution in adhesion force and elastic modulus images, respectively. The contrast in mechanical properties depends on the proper choice of the probe and on the control of the pixel size and the imaging force. The study also demonstrates that all these parameters are mutually interconnected and may have contradictory influences.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available