4.8 Article

Big, Deep, and Smart Data in Scanning Probe Microscopy

Journal

ACS NANO
Volume 10, Issue 10, Pages 9068-9086

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.6b04212

Keywords

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Funding

  1. Laboratory Directed Research and Development Program of Oak Ridge National Laboratory
  2. Eugene P. Wigner Fellowship at Oak Ridge National Laboratory
  3. Compute and Data Environment for Science (CADES)
  4. applied mathematics program at the DOE
  5. Oak Ridge Leadership Computing Facility, a DOE Office of Science User Facility at ORNL [DE-AC05-00OR22725]

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Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining,, visual analytics, and knowledge discovery technologies.

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