4.8 Article

Photoluminescence Dynamics of Aryl sp3 Defect States in Single-Walled Carbon Nanotubes

Journal

ACS NANO
Volume 10, Issue 9, Pages 8355-8365

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.6b02986

Keywords

carbon nanotubes; doping; exciton localization; photoluminescence; time-correlated single photon counting; diazonium salts

Funding

  1. LANL
  2. LANL LDRD
  3. National Science Foundation [CHE-1507974]
  4. Direct For Mathematical & Physical Scien
  5. Division Of Chemistry [1507974] Funding Source: National Science Foundation

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Photoluminescent defect states introduced by sp(3) functionalization of semiconducting carbon nanotubes are rapidly emerging as important routes for boosting emission quantum yields and introducing new functionality. Knowledge of the relaxation dynamics of these states is required for understanding how functionalizing agents (molecular dopants) may be designed to access specific behaviors. We measure photoluminescence (PL) decay dynamics of sp3 defect states introduced by aryl functionalization of the carbon nanotube surface. Results are given for five different nanotube chiralities, each doped with a range of aryl functionality. We find that the PL decays of these sp3 defect states are biexponential, with both components relaxing on time scales of similar to 100 ps. Exciton trapping at defects is found to increases PL lifetimes by a factor of 5-10, in comparison to those for the free exciton. A significant chirality dependence is observed in the decay times, ranging from 77 ps for (7,5) nanotubes to >600 ps for (5,4) structures. The strong correlation of time constants with emission energy indicates relaxation occurs via multiphonon decay processes, with close agreement to theoretical expectations. Variation of the aryl dopant further modulates decay times by 10-15%. The aryl defects also affect PL lifetimes of the free E-11 exciton. Shortening of the E-11 bright state lifetime as defect density increases provides further confirmation that defects act as exciton traps. A similar shortening of the E-11 dark exciton lifetime is found as defect density increases, providing strong experimental evidence that dark excitons are also trapped at such defect sites.

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