Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 8, Issue 39, Pages 26400-26406Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b08847
Keywords
surface defects; impurities; tungsten diselenide; scanning probe microscopy; photoemission
Funding
- Center for Low Energy Systems Technology (LEAST), one of the six SRC STARnet Centers - MARCO
- Center for Low Energy Systems Technology (LEAST), one of the six SRC STARnet Centers - DARPA
- Southwest Academy on Nanoelectronics (SWAN) Center, a SRC center - Nanoelectronics Research Initiative
- Southwest Academy on Nanoelectronics (SWAN) Center, a SRC center - NIST
- US/Ireland R&D Partnership (UNITE) under the NSF award [ECCS-1407765]
- Div Of Electrical, Commun & Cyber Sys
- Directorate For Engineering [1407765] Funding Source: National Science Foundation
Ask authors/readers for more resources
Layered semiconductor compounds represent alternative electronic materials beyond graphene. WSe2 is one of the two-dimensional materials with wide potential in opto- and nanoelectronics and is often used to construct novel three-dimensional architectures with new functionalities. Here, we report the topography and the electronic property of the WSe2 characterized by means of scanning tunneling microscopy and spectroscopy (STM and STS), X-ray photoelectron spectroscopy (XPS), and inductively coupled plasma mass spectrometry. The STM images reveal the presence of atomic-size imperfections and a variation in the electronic structure caused by the presence of defects and impurities below the detection limit of XPS. Both STS and photoemission reveal a spatial variation in the Fermi level position. The analysis of the core levels indicates the presence of different doping levels. The presence of a large concentration of defects and impurities has a strong impact on the electronic properties of the WSe2 surface. Our findings demonstrate that the growth of controllable and high quality two-dimensional materials at nanometer scale is one of the most challenging tasks that requires further attention.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available