Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 8, Issue 30, Pages 19402-19409Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b04104
Keywords
perovskite solar cells; Kelvin probe force microscopy; scanning probe microscopy; space charge layer; ion migration; charge trapping
Funding
- IRTG [1404]
- China Scholarship Council
- MEXT, Japan [15H05754]
- Grants-in-Aid for Scientific Research [15H05754] Funding Source: KAKEN
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Efficient charge extraction within solar cells explicitly depends on the optimization of the internal interfaces. Potential barriers, unbalanced charge extraction, and interfacial trap states can prevent cells from reaching high power conversion efficiencies. In the case of perovskite solar cells, slow processes happening on time scales of seconds cause hysteresis in the current voltage characteristics. In this work, we localized and investigated these slow processes using frequency-modulation Kelvin probe force microscopy (FM-KPFM) on cross sections of planar methylammonium lead iodide (MAPI) perovskite solar cells. FM-KPFM can map the charge density distribution and its dynamics at internal interfaces. Upon illumination, space charge layers formed at the interfaces of the selective contacts with the MAPI layer within several seconds. We observed distinct differences in the charging dynamics at the interfaces of MAPI with adjacent layers. Our results indicate that more than one process is involved in hysteresis. This finding is in agreement with recent simulation studies claiming that a combination of ion migration and interfacial trap states causes the hysteresis in perovskite solar cells. Such differences in the charging rates different interfaces cannot be separated by conventional device measurements.
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