Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 8, Issue 23, Pages 14701-14708Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b00480
Keywords
n-type organic field-effect transistors (OFETs); triphenodioxazines (TPDOs); cross-linked polymer gate dielectrics; poly(methyl methacrylate) (PMMA); flexible electronics
Funding
- Horizon Marie Sklodowska-Curie Research and Innovation Staff Exchange (RISE) Programme [645760]
- Vice Presidency for External Relations (DRI) of the Ecole polytechnique (EP)
- Royal Saudi Naval Forces
- Universite de Bordeaux
- Centre National de la Recherche Scientifique (CNRS)
- Agence Nationale de la Recherche (ANR) (FMOCSOLE) [ANR-BLAN-2010-93801]
- Institut Polytechnique de Bordeaux
- Marie Curie Actions (MSCA) [645760] Funding Source: Marie Curie Actions (MSCA)
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Recent improvement in the performance of the n-type organic semiconductors as well as thin, gate dielectrics based on cross-linked polymers: offers new opportunities to develop high-performance low-voltage n-type OFETs suitable for organic complementary circuits. Using TIPS-tetracyano-triphenodioxazine (TIPS-TPDO-tetracN) and cross-linked poly(methyl methacrylate) (c-PMMA.),, respectively as n-type organic semiconductor and gate dielectric, linear regime field-effect mobility (1.8 +/- 0.2) X 10(-2) cm(2) V(-1)s(-1), small spatial standard deviation of threshold voltage (similar to 0.1 V), and operating voltage less than 3 V are attainable with the same device structure and contact materials used commonly for p-type OFETs. Through comparative static and dynamic characterizations of c-PMMA and PMMA gate dielectrics, it is shown that both smaller thickness and larger relative permittivity of c-PMMA. contributes to reduced operating voltage. Furthermore, negligible hysteresis brings evidence to small trap states in the semiconductor near gate dielectric of the n-type OFETs with c-PMMA. The use of TIPS-TPDO-tetraCN and c-PMMA is fully compatible with polyethylene terephthalate substrate, giving promise to various flexible applications.
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