Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 8, Issue 24, Pages 14994-14999Publisher
AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b04214
Keywords
thin-film photovoltaics; Cryo-FIB; KPFM; CIGSe; back contacts
Funding
- U.S. Department of Energy, Energy Efficiency and Renewable Energy Program [DE-EE0006334]
- National Science Foundation [DMR 1207213]
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Cryogenic focused ion beam (Cryo-FIB) milling at near grazing angles is employed to fabricate cross-sections on thin Cu(In,Ga)Se-2 with >8x expansion in thickness. Kelvin probe force microscopy (KPFM) on sloped cross sections showed reduction in grain boundaries potential deeper into the film. Cryo Fib-KPFM enabled the first determination of the electronic structure of the Mo/CIGSe back contact, where a sub 100 nm thick MoSey assists hole extraction due to 45 meV higher work function. This demonstrates that CryoFIB-KPFM combination can reveal new targets of opportunity for improvement in thin -films photovoltaics such as high work -function contacts to facilitate hole extraction through the back interface of CIGS.
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