4.8 Article

Cobalt Oxide (CoOx) as an Efficient Hole-Extracting Layer for High Performance Inverted Planar Perovskite Solar Cells

Journal

ACS APPLIED MATERIALS & INTERFACES
Volume 8, Issue 49, Pages 33592-33600

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsami.6b10803

Keywords

cobalt oxide; hole-extraction layer; perovskite solar cell; photoluminescence; photovoltaic devices

Funding

  1. Ministry of Education, Culture, Sports, Science and Technology of Japan [JP23225006, JP15H00856]
  2. Nanotechnology Platform (Hokkaido University)
  3. Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials (Five-Star Alliance) of MEXT, Taiwan Ministry of Science and Technology [MOST 105-2119-M-009-011-MY3, MOST 104-2119-M-009-001]
  4. Grants-in-Aid for Scientific Research [15K17438, 15K04589, 15H01073, 15H00856, 15K20833] Funding Source: KAKEN

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CoOx is a promising hole-extracting layer (HEL) for inverted planar perovskite solar cells with device configuration ITO/CoOx/CH3NH3PbI3/PCBM/Ag. The devices fabricated according to a simple solution procedure showed the best photovoltaic performance attaining power conversion efficiency (PCE) of 14.5% under AM 1.5 G 1 sun irradiation, which is significantly superior to those of materials fabricated with a traditional HEL such as PEDOT:PSS (12.2%), NiOx (10.2%), and CuOx (9.4%) under the same experimental conditions. We characterized the chemical compositions with XPS, crystal structures with XRD, and film morphology with SEM/AFM techniques. Photoluminescence (PL) spectra and the corresponding PL decays for perovskite deposited on varied HEL films were recorded to obtain the hole-extracting characteristics, for which the hole extracting times show the order CoOx (2.8 ns) < PEDOT:PSS (17.5 ns) < NiOx (22.8 ns) < CuOx (208.5 ns), consistent with the trend of their photovoltaic performances. The reproducibility and enduring stability of those devices were examined to show the outstanding long-term stability of the devices made of metal oxide HEL, for which the CoOx device retained PCE approximate to 12% for over 1000 h.

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