Journal
JOURNAL OF ELECTRONIC MATERIALS
Volume 48, Issue 2, Pages 925-929Publisher
SPRINGER
DOI: 10.1007/s11664-018-6806-4
Keywords
TES; sensor; bolometer; AFM; XRD
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Funding
- National Natural Science Foundation of China
- State Key Program
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A four-by-four transition-edge sensor (TES) bolometer array based on an Al/Ti bilayer on an Si3N4 substrate for thermal connection, showing an unbiased transition temperature of 1.2K, was fabricated and characterized. Formation of the Al/Ti bilayer with tetragonal structure was confirmed by x-ray diffraction analysis. The surface roughness of 3.11nm calculated by atomic force microscopy was found to be negligible compared with the particle size (19.66nm), indicating a smooth surface. The smoothness of the resistance-temperature (R-T) curve corresponds to the smoothness of the surface of the bilayer sensor, and the superconducting transition curve of the suspended bilayer TES was designed with a biased T-c of 0.45K and T-c=2mK. Such TES bolometer arrays are suitable for astrophysical observations and are extensively used in cosmic microwave background polarization detection.
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