Journal
CHEMSUSCHEM
Volume 12, Issue 3, Pages 603-611Publisher
WILEY-V C H VERLAG GMBH
DOI: 10.1002/cssc.201802383
Keywords
atomic force microscopy; materials science; natural products; scanning probe microscopy; surface analysis
Funding
- Austrian Science Fund (FWF) [P29562-N28]
- Austrian Science Fund (FWF) [P29562] Funding Source: Austrian Science Fund (FWF)
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Briefly, herein the use of atomic force microscopy (AFM) in the characterization of molecules and (bioengineered) materials related to chemistry, materials science, chemical engineering, and environmental science and biotechnology is reviewed. First, the basic operations of standard AFM, Kelvin probe force microscopy, electrochemical AFM, and tip-enhanced Raman microscopy are described. Second, several applications of these techniques to the characterization of single molecules, polymers, biological membranes, films, cells, hydrogels, catalytic processes, and semiconductors are provided and discussed.
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