Resistive detection of the Neel temperature of Cr2O3 thin films

Although bulk magnetic properties of various antiferromagnets have been vigorously studied since long ago, their properties in the form of thin films, which are more relevant to antiferromagnetic spintronic devices, have not been investigated as much. In this work, we characterized the Neel temperature of Cr2O3 thin films by investigating the temperature dependence of the spin Hall magnetoresistance in Cr2O3/Pt bilayers. A precise determination of the Neel temperature was made possible by carefully designing the direction of the magnetic anisotropy in Cr2O3. The results provide a reliable way to determine the Neel temperature of antiferromagnetic thin films. Published under license by AIP Publishing.