Journal
APPLIED PHYSICS LETTERS
Volume 113, Issue 26, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.5065486
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Funding
- NSF TANMS ERC Award [1160504]
- W. M. Keck Foundation
- AFRL [FA8650-14-C-5706]
- Directorate For Engineering [1160504] Funding Source: National Science Foundation
- Div Of Engineering Education and Centers [1160504] Funding Source: National Science Foundation
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Layered magnetic/piezoelectric heterostructures have drawn a great amount of interest for their potential use in ultra-sensitive magnetoelectric (ME) sensors, ME antennas, voltage tunable inductors, magnetic tunable resonators, etc. It is critically important to characterize the saturation magnetostriction, piezomagnetic coefficient, Delta E effect, and magnetomechanical coupling factor of magnetic thin films, which determine the performance of these ME devices. In this work, a sensitive system has been developed to measure these magnetomechanical properties, on which several different magnetostrictive thin films on the silicon substrate cantilever were characterized. A 0.015 ppm limit of detection of the magnetostriction tester and a frequency resolution of 0.01 Hz of the Delta E tester have been achieved. After magnetic anneal treatment, a record high piezomagnetic coefficient of 12 ppm/Oe, a giant magnetic field induced Young's modulus change of 153 GPa, and a high effective magnetomechanical coupling factor of 0.84 have been measured in FeGaB thin films. Published by AIP Publishing.
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