4.5 Article

Robust 3D surface recovery by applying a focus criterion in white light scanning interference microscopy

Related references

Note: Only part of the references are listed.
Article Computer Science, Information Systems

A comparison of contrast measurements in passive autofocus systems for low contrast images

Xin Xu et al.

MULTIMEDIA TOOLS AND APPLICATIONS (2014)

Article Computer Science, Artificial Intelligence

Analysis of focus measure operators for shape-from-focus

Said Pertuz et al.

PATTERN RECOGNITION (2013)

Article Optics

Vibration detection using focus analysis of interferograms

Jae Lord Dexter C. Filipinas et al.

APPLIED OPTICS (2012)

Article Optics

Analysis on enhanced depth of field for integral imaging microscope

Young-Tae Lim et al.

OPTICS EXPRESS (2012)

Article Engineering, Multidisciplinary

Surface measurement errors using commercial scanning white light interferometers

F. Gao et al.

MEASUREMENT SCIENCE AND TECHNOLOGY (2008)