Journal
STRUCTURAL DYNAMICS-US
Volume 1, Issue 3, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4875347
Keywords
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Funding
- U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division
- Department of Energy (DOE) Office of Science Graduate Fellowship Program (DOE SCGF)
- Air Force Office of Scientific Research through the Multidisciplinary University Research Initiative Program [FA9550-08-1-0340]
- Center for Solar and Thermal Energy Conversion, an Energy Frontier Research Center - U.S. Department of Energy, Office of Basic Energy Sciences [DE-SC0000957]
- Army Research Office [W911NF-10-1-0482]
- Department of Energy, Laboratory Directed Research and Development funding [DE-AC02-76SF00515]
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We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO3, Pb(Zr, Ti)O-3, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
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