Characterization of yttria-stabilized zirconia films deposited by dip-coating on La0.7Sr0.3MnO3 substrate: Influence of synthesis parameters

Yttria-stabilized zirconia (YSZ, ZrO2-8% Y2O3) films were deposited onto lanthanum strontium manganite (LSM, La0.7Sr0.3MnO3) substrates using dip-coating process aiming for the application in solid oxide fuel cells (SOFCs). YSZ precursor was prepared by sol-gel method; three values of the organic/inorganic concentration ratio (1, 3 and 5) were utilized and the sol viscosity was adjusted (60 mPa.s and 100 mPa.s) before deposition on the substrate. The influence of these synthesis parameters on the structure and morphology of the deposited films was examined by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The films showed characteristic peaks of LSM, YSZ (with cubic structure) and secondary phases of SrZrO3 and La2O3. Depending on the synthesis conditions, crack-free, homogeneous and well adhered films were obtained, with thickness of 11-24 mu m.