Journal
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY
Volume 1, Issue 3, Pages 201-205Publisher
KOREAN SOC PRECISION ENG
DOI: 10.1007/s40684-014-0025-0
Keywords
Kelvin probe microscopy; Solid oxide fuel cell; Charge transfer reaction; Interface
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Funding
- Basic Science Research Program through the National Research Foundation of Korea (NRF) - Ministry of Science, ICT & Future Planning [NRF-2013R1A1A1059845]
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Localized charge transfer reactions induced by the external bias were observed near the electrode-electrolyte interfaces by Kevin probe microscopy. Spatially resolved potential measurements revealed the localized charge accumulation and rearrangement driven by the external bias, which were ascribed to oxidation and reduction of the oxide surface. This in situ measurement of charge distribution with spatial information under controlled environments can be particularly useful in investigating the charge transfer reactions on the surfaces of functional materials and enhance our understanding of many electronic and electrochemical devices.
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