Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 22, Issue -, Pages 249-255Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577514027854
Keywords
X-ray FEL; phasing; radiation damage; SFX
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Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.
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