Journal
JOURNAL OF SYNCHROTRON RADIATION
Volume 22, Issue -, Pages 1528-1530Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577515016306
Keywords
near-ambient pressure; photoemission; gas-phase photoemission; liquid-air interface
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Funding
- Swiss National Science Foundation [153578]
- ETH Research Grant [ETH-20 13-2]
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A 30 mu m pinhole is introduced in the intermediate focus of the SIM beamline at the Swiss Light Source to improve the spot size at the second downstream focus, which is used here for liquid jet X-ray photoelectron spectroscopy experiments. The 30 mu m pinhole reduces the beam dimensions from 250 (v) x 100 (h) mu m to 75 x 45 mu m for a vertical exit slit of 100 mu m. The smaller X-ray spot results in a substantial decrease in the gas-phase contribution of the spectra from 40% down to 20% and will help to simplify the interpretation and peak assignments of future experiments.
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