Journal
SCIENTIFIC REPORTS
Volume 7, Issue -, Pages -Publisher
NATURE PUBLISHING GROUP
DOI: 10.1038/s41598-017-05499-3
Keywords
-
Categories
Funding
- Academy of Finland [279055]
- Office of Naval Research [N00014-14-1-0126]
- Svenska Tekniska Vetenskapsakademien i Finland
- Magnus Ehrnrooth Foundation
- foundation of Agneta and Carl-Erik Olin
- German Federal Ministry for Education and Research (BMBF) through the Inno Profille project Organische p-i-n Bauelemente 2.2
Ask authors/readers for more resources
A method to determine the doping induced charge carrier profiles in lightly and moderately doped organic semiconductor thin films is presented. The theory of the method of Charge Extraction by a Linearly Increasing Voltage technique in the doping-induced capacitive regime (doping-CELIV) is extended to the case with non-uniform doping profiles and the analytical description is verified with drift-diffusion simulations. The method is demonstrated experimentally on evaporated organic smallmolecule thin films with a controlled doping profile, and solution-processed thin films where the nonuniform doping profile is unintentional, probably induced during the deposition process, and a priori unknown. Furthermore, the method offers a possibility of directly probing charge-density distributions at interfaces between highly doped and lightly doped or undoped layers.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available