Journal
JOURNAL OF COMPUTATIONAL ELECTRONICS
Volume 7, Issue 3, Pages 355-358Publisher
SPRINGER
DOI: 10.1007/s10825-008-0245-z
Keywords
Silicon nanowire; Boltzmann transport equation; Low-field mobility; Surface roughness scattering
Funding
- PULLNANO project via the IU.NET Consortium [FP6 IST-026828-IP]
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In this paper we investigate the effect of surface roughness scattering on transport in silicon nanowire FETs using a deterministic Boltzmann equation solver previously developed by the authors. We first solve the coupled Schrodinger-Poisson equations to extract the subband profiles along the channel, and then address the transport problem. Some features of the low-field mobility as a function of the wire diameter and gate bias are discussed and the effect of surface roughness on the I-V characteristics is presented.
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