Journal
PROGRESS IN NATURAL SCIENCE-MATERIALS INTERNATIONAL
Volume 25, Issue 5, Pages 399-404Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.pnsc.2015.09.015
Keywords
Thin films; Microstructure; Dielectric properties; Sol gel method; Alkline-earth metal titante
Funding
- National Natural Science Foundation of China [51572113]
- Tribology Science Fund of State Key Laboratory of Tribology [SKLTKF13B08]
- Changzhou Science and Technology Program [CC20140002]
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This paper focuses on the effects of alkline-earth metal titante AETiO(3) (AE=Mg, Ca, Sr) doping on the microstructure and electric characteristics of CaCu3Ti4O12 thin films prepared by the sol gel method. The results showed that the grain size of CCTO thin films could be increased by MgTiO3 doping. The movement of the grain boundaries was impeded by the second phases of CaTiO3 and SrTiO3 concentrating at grain boundaries in CaTiO3 and SrTiO3 doped CCTO thin films Rapid ascent of dielectric constant could be observed in 0.1 Mg TiO3 doped CCTO thin films, which was almost as three times high as pure CCTO thin film and the descent of the dielectric loss at low frequency could also be observed. In addition, the nonlinear coefficient (alpha), threshold voltage (V-T) and leakage current (I-L) of of AETiO(3) doped CCTO thin films (AE=Mg, Ca, Sr) showed different variation with the increasing content of the MgTiO3, CaTiO3 and SrTiO3. (C) 2015 The Authors. Production and hosting by Elsevier B.V.
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