4.4 Article

Evaluation of Thermal Cycling Reliability of Sintered Nanosilver Versus Soldered Joints by Curvature Measurement

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCPMT.2013.2296315

Keywords

Bending curvature measurement; large-area joints; sintered-silver joints; thermomechanical reliability

Funding

  1. United States Office of Naval Research [N00014-09-1-0566]
  2. Seebeck Program of the National Science Foundation [EEC-9731677]

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Low-temperature silver sintering technology is emerging as a lead-free die-attach solution to significantly improve the heat dissipation and reliability packaging of power devices and modules die attached by solder alloys. With the recent introduction of nanosilver materials, which dramatically simplify the bonding process by lowering the required pressure down to a few megapascals, the silver sintering die-attach solution is poised for wide use in the manufacture of electronic products. In this paper, the thermomechanical reliability of sintered-silver joints was studied in comparison with soldered joints of two lead-free solders, SN100C and SAC305. Die-attach samples were fabricated by bonding 10 mm x 10 mm silicon mechanical chips to silver-metalized copper blocks and direct-bond copper (DBC) substrates according to the respective heating profiles of a nanosilver paste and the two solders. The die-attach samples were thermally cycled between -40 degrees C and +125 degrees C. The bonding reliability was evaluated by measuring the bending curvatures of the cycled samples and examining the cross sections of the samples under an electron microscope. Bending of the bonded structures, which is the result of mismatched coefficients of thermal expansion between silicon and copper or DBC, offered a nondestructive method for monitoring the integrity of the bond line. The bending curvatures of all of the die-attach samples decreased rapidly after they were thermally cycled. Most of the drop in curvature can be attributed to stress relaxation in the bonding materials without bond-line cracking. However, in the samples on copper blocks, after 800 cycles, the curvatures of the soldered samples decreased to near 0 m(-1), but those of the silver-sintered samples still had about 30% of the original curvatures. Scanning electron microscopy images showed that the joints of the soldered samples with near 0 m(-1) curvature had been cracked almost all the way through, but the joints of the sintered samples were still intact. These results demonstrate that the sintered-silver joints are more reliable than the soldered joints.

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