4.4 Article

Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensor

Journal

BEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume 4, Issue -, Pages 10-19

Publisher

BEILSTEIN-INSTITUT
DOI: 10.3762/bjnano.4.2

Keywords

atomic force microscopy; force spectroscopy; lateral forces; mechanical vibrations; qPlus

Funding

  1. EPSRC

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In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.

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