Journal
BEILSTEIN JOURNAL OF NANOTECHNOLOGY
Volume 4, Issue -, Pages 10-19Publisher
BEILSTEIN-INSTITUT
DOI: 10.3762/bjnano.4.2
Keywords
atomic force microscopy; force spectroscopy; lateral forces; mechanical vibrations; qPlus
Funding
- EPSRC
Ask authors/readers for more resources
In qPlus atomic force microscopy the tip length can in principle approach the length of the cantilever. We present a detailed mathematical model of the effects this has on the dynamic properties of the qPlus sensor. The resulting, experimentally confirmed motion of the tip apex is shown to have a large lateral component, raising interesting questions for both calibration and force-spectroscopy measurements.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available